170年的業(yè)經(jīng)驗(yàn)以及所有設(shè)備無與倫比的數(shù)據(jù)處理能力:憑借其基于應(yīng)用程序的quanfangwei互聯(lián)工業(yè)顯微鏡解決方案組合,蔡司幫助您將數(shù)據(jù)轉(zhuǎn)化為可操作的信息,更快地做出正確的決策。
本公司12月28號09點(diǎn)07分報道:蔡司工業(yè)顯微鏡2022年產(chǎn)品應(yīng)用域
(http://www.yulongyw.com/c111697/products/d10944139.html)
YI、工業(yè)顯微鏡產(chǎn)品概述:
二、工業(yè)顯微鏡特點(diǎn):
相關(guān)關(guān)鍵詞:工業(yè)顯微鏡,電腦斷層掃描測量機(jī),ZEISS O-DETECT,多探頭測量機(jī)(光學(xué)測量),懸臂式三坐標(biāo)測量機(jī),大型三坐標(biāo)測量機(jī),車間三坐標(biāo)測量機(jī),橋式三坐標(biāo)測量機(jī),三坐標(biāo)測量機(jī),測頭接口,交換架和附件,手動系統(tǒng),控制器,機(jī)動測座系統(tǒng),NC4高精度激光對刀系統(tǒng),PH20五軸觸發(fā)式系統(tǒng),觸發(fā)式測頭系統(tǒng),掃描測頭系統(tǒng),APC對刀儀,HP高精度對刀臂和RP3對刀儀,OTS 3D觸發(fā)式對刀儀,RTS無線電纜對刀儀,3D對刀儀(Primo Radio 3D Tool Setter),刀長對刀儀(Primo LTS),TS27R接觸式對刀儀,TS34接觸式對刀儀,TRS2非接觸式刀具破損檢測系統(tǒng),REVO五軸測量系統(tǒng),OLP40車床觸發(fā)式測頭,OMP60光學(xué)測頭,RMP40無線電測頭,RLP40無線電車床測頭,RMP60無線電測頭,LP2模塊化測頭系統(tǒng),尋邊器,工件測頭
Key words: Industrial microscope, Computed tomography measuring machine,ZEISS O - DETECT probe measuring machine, optical measurement, cantilever type three coordinate measuring machine, three coordinate measuring machine, large workshop three coordinate measuring machine, bridge type three coordinate measuring machine, three coordinate measuring machine, measuring head interface, exchange and accessories, manual system, controller, motor test system, NC4 high-precision laser system for the knife, PH20 five-axis trigger system, touch Hair-type probe system, scanning probe system,APC Tool setting instrument,HP high precision Tool setting arm and RP3 Tool setting instrument,OTS 3D trigger Tool setting instrument,RTS wireless cable Tool setting instrument, Primo Radio 3D Tool Setter, Tool length Tool setting instrument (Primo) LTS),TS27R contact tool tester,TS34 contact tool tester,TRS2 non-contact tool damage detection system,REVO five-axis measuring system,OLP40 lathe trigger probe,OMP60 optical probe,RMP40 radio probe,RLP40 radio lathe probe,RMP60 radio probe,LP2 modular Probe system, edge finder, workpiece probe
關(guān)鍵詞:工業(yè)顯微鏡 電腦斷層掃描測量機(jī) ZEISS O-DETECT 多探頭測量機(jī)(光學(xué)測量